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Laser Particle Sizer ANALYSETTE 22 NanoTec – High-end instrument for particle size measurement down to the nano range
publication date: Nov 22, 2010
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author/source: FRITSCH Particle Sizing
The ANALYSETTE 22 NanoTec offers with the measuring range of 10 nm to 2000 µm - true entry into the nano range. This is achieved through the use of a second laser beam that is directed at the sample from behind, allowing for detection of the back-scattering light. The patented capability to move the measurement cell within the beam path of the optical system during the measurement also results in a very high number of effective detection channels, which can be over 500 for the NanoTec model, which leads to a correspondingly high number of particle size classes and therefore a very high resolution. The special shape of the detector combined with intelligent evaluation software LaPaSS also allows information to be obtained about the particle shape. The Laser Particle Sizer ANALYSETTE 22 NanoTec is an instrument with universal applications for the determination of particle size distributions and particle shape. It is used in research and development, as well as in quality control and process control. The ANALYSETTE 22 is the only instrument in the world with which particle size distribution and the particle shape can be analysed in a single measurement. Through combination of corresponding components, you can configure a measurement system that is precisely adapted to your needs, with reliability and efficiency guaranteed by FRITSCH as a specialist in particle measurement technology. Your advantages with the ANALYSETTE 22 NanoTec
FRITSCH Laser Particle Sizer: Sizing with competence. Send us your sample for a free of charge sample measurement - we will send you a detailed analysis protocol. Compare for yourself! For further product information please visit www.fritsch-laser.de/en/products/nanotec/ |
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FRITSCH Particle Sizing Instruments offer state-of-the-art laser technology for an unique price performance ratio, for each particular area of application and utilization. An extra plus: the special, patented FRITSCH measuring method by laser diffraction inside the convergent laser beam. Your advantage: a simple continuous adjustment of the measuring area as well as up to now unknown number of measuring channels.