Horiba Scientific Introduces New Clue Series Detectors for Scanning Electron Microscopes

publication date: Oct 31, 2017
 | 
author/source: HORIBA Scientific

HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes.

horibaHORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM).

HORIBA CLUE Series include: 

SEM-CL helps discover the nature of defects, structures, stress at the nanoscale (<20nm spatial resolution), making it the ideal tool for novel nanomaterials characterization. Designed for enhanced flexibility for multiple applications of zircons, phosphors and other minerals to semiconductor Nitrides, Thin Films solar cells, and 2D materials, the HORIBA CLUE Series offers the ultimate sensitivity for your sample of interest. 

HORIBA Scientific’s expertise in optics, detectors, vacuum technology and spectroscopy provides every customer with accurate information on hardware and software, regardless of your sample type. The HORIBA CLUE Series is already deployed in internationally recognized academic and industry research and quality control laboratories worldwide. 

The HORIBA CLUE Series come with on-site installation and training, technical support, and application support to help optimize your experiment. 


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