Channels

 

Special Offers & Promotions

 

 

Latest News

 

 

View Channel

New Products

 

 

View Channel

Video Presentations

 

 

View Channel

Separation Science

 

 

View Channel

Microscopy & Image Analysis

 

 

View Channel

Laboratory Automation & IT Solutions

 

 

View Channel

 

New AFM platform from Anasys for analytical measurements

afm+, the new AFM platform from AnasysAnasys Instruments, the company that pioneered nanoscale thermal analysis and nanoscale IR spectroscopy using an AFM, has chosen the Fall 2011 MRS meeting to introduce a brand new, easy-to-use research and analysis tool. The afm+ is the first fully integrated AFM platform to offer three important analytical capabilities.

Using Anasys' proprietary thermal probe technology for Nanoscale Thermal Analysis (nano-TA), the afm+ allows the user to obtain transition temperatures on any local feature of a sample or to obtain a transition temperature map. It makes measurement of glass transition temperatures (Tg) and melting temperatures (Tm) a simple operation. This mode also includes Scanning Thermal Microscopy (SThM) which allows the user to map relative thermal conductivity and relative temperature differences across the sample.

Transition temperature microscopy (TTMTM) is used to quantify and map thermal transitions in heterogeneous materials. Transition temperature microscopy (TTM) is a fully automated mode in which an array of nano-TA measurements is rapidly performed and each temperature ramp is automatically analyzed to determine the transition temperature.

Finally, the afm+ is fully upgradeable to perform nanoscale infrared spectroscopy for measuring and mapping chemical composition on the nanoscale. This technology enables point-and-click nanoscale IR spectroscopy that produces IR spectra that correlate to FTIR libraries. This makes chemical imaging on the nanoscale a reality. The upgrade options also include the ability to measure the mechanical properties of samples. Data may be collected using a contact resonance method to map stiffness variations simultaneously with the topography.

In summary, the afm+ is providing the basis for a multifunctional nanoscale measurement suite. The afm+ is fully upgradeable to the Anasys nanoIR system, a probe-based measurement tool that utilizes infrared spectroscopy to reveal chemical composition at the nanoscale. The nanoIR also provides high-resolution characterization of local topographic, mechanical, and thermal properties. Potential application areas span the realms of polymer science, materials science, and life science, including detailed studies of structure-property correlations.

For further details, please visit www.anasysinstruments.com


If you have not logged into the website then please enter your details below.



 

Subscribe to any of our newsletters for the latest on new laboratory products, industry news, case studies and much more!

Newsletters from Lab Bulletin

 

Request your free copies HERE

 

 

 

Popular this Month

Top 10 most popular articles this month

 

 

Today's Picks

 


 

Looking for a Supplier?

Search by company or by product

 


Company Name:

Product:


 

 

 

 

Please note Lab Bulletin does not sell, supply any of the products featured on this website. If you have an enquiry, please use the contact form below the article or company profile and we will send your request to the supplier so that they can contact you directly.

Lab Bulletin is published by newleaf marketing communications ltd.


 

Media Partners

 

Exhibitions & Events