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All articles from JEOL USA Inc.

  JEOL Begins Remote Demonstrations of New Ultrahigh Resolution Field Emission SEM in July

The launch of a new JEOL Field Emission Scanning Electron Microscope during the summer of 2020 includes virtual demonstrations of its powerful performance directly to those in the market for an analytical ultrahigh resolution SEM. JEOL’s new JSM-IT800 is the company’s top-of-the-line microscope with ultrahigh spatial resolution imaging and analysis at the nanoscale....

 

  JEOL USA showcases product updates in MS, SEM and NMR

JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to showcase the latest updates to its core product range at Pittcon 2020. JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectrometry, and more than 50 years of e-beam lithography leadership. JEOL expanded its mass spectrometer product line with the development of a GC-triple quadrupole mass spectrometer system....

 

  JEOL Introduces New Field Emission SEM With Automated Analytical Intelligence

JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered optics of the SEM....

 

 

 

 

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