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New! CorrStub SEM Specimen Stub for Correlative Microscopy and GSR Analysis
Introducing CorrStub™ - a unique range of SEM specimen stubs designed specifically for repeatable analysis over the same reference point
Combinations of techniques such as SEM and light microscopy are often used to determine complete characterisation of specimens. With this in mind Agar Scientific have developed the new CorrStub™ specimen stub, incorporating a unique referencing feature allowing analysis of exactly the same point easily and repeatedly over alternative instruments.
- Precise X-Y reference point for mounted specimens
- A unique V-notch provides a zero coordinate reference point – repeatable over alternative instruments
- CorrStub can be laser etched with a unique combination of one alphanumerical and four numerical characters for sample identification
CorrStub can also be supplied with high conductivity carbon tabs precisely applied and ready loaded in individual plastic tube or box.