Deben has been chosen by Phenom-World to supply the Microtest Tensile Stage as an accessory to their Phenom XL range of desktop scanning electron microscopes. 

Phenom-World, the leading global supplier of desktop scanning electron microscopes (SEMs), has once again chosen Deben as their preferred supplied of accessories for their Phenom XL range of desktop scanning electron microscopes.....

The excellent performance in a wide range of applications offers a serious alternative to floor model SEMs

Phenom-World, the leading global supplier of desktop scanning electron microscopes (SEMs), today introduced its 5^th generation Phenom Pro and ProX SEMs. The systems’ enhanced imaging performance, 20 percent resolution improvement, larger choice of detectors and new software significantly widen their application range, while still maintaining the ease-of-use that Phenom-World’s SEMs are known for.....

Meet world’s first Mobile SEM - the Phenom desktop SEM. A fully integrated and accredited scanning electron microscope (SEM) with EDX to be used on every location for fast and accurate investigations and analysis.

The Phenom ProX is the ultimate all-in-one imaging and X-ray analysis system (EDX). With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Besides point analysis, the optional Elemental Mapping and Line Scan software allows further analysis of the distribution of elements....

Designed especially for the Phenom Desktop SEM PoroMetric Software for Fully Automated Measurement and Analysis of Pores

DELMIC develops and manufactures products which are focused on high performance, user friendly, integrated microscopy solutions.

In a collaborative development with electron microscope provider Phenom-World, both companies announce the launch of Delphi, the world’s first integrated correlative tabletop fluorescence and electron microscope at the 18^th IMC in Prague. DELMIC and Phenom-World announce Delphi™, the world’s first integrated correlative tabletop fluorescence and electron microscope. DELMIC produces high-performance, user-friendly integrated microscopy solutions while...

The advent of nonwoven nanofibers is enabling the development of a new generation of highly sensitive filters. Surging global demand is creating a compelling need for improved production and quality control methods.

Currently, much of the industry is using old technology for process monitoring and control, yielding limited data. As a result, critical details that affect a filter’s performance are often overlooked because accurate performance data cannot be easily and quickly verified. Without SEM imaging, it is not possible to discern the important features during nanofiber filter design. The Fibermetric software supported on the Phenom desktop SEM is the first integrated system designed for submicron fiber development....

In the pharmaceutical industry, pharmaceutical dosage forms are getting increasingly important as a basis for making more effective drugs. In the successful development of a new dosage form, formulation development typically plays a crucial role in the introduction and application of state of-the-art pharmaceutical technology.

The manufacturability and/or bioavailability of many of these dosage forms regularly depend on the characteristics of the individual ingredients. It is for this reason, that it is extremely important that the bulk characteristics of so-called particulate systems such as powders and suspensions can be accurately monitored....

The Phenom in combination with the ParticleMetric software is a powerful analyses tool for the pharmaceutical industry.

With 100,000x magnification, intuitive user interface and never lost navigation, the Phenom removes the difficulties associated with operating a traditional SEM. High resolution images of pharmaceutical particles can be obtained in the lab within seconds. Acquired images can then be analyzed using the ParticleMetric software, giving you visual and statistical data of your particles. The Phenom can help shorten drug development and validation cycles, enabling faster time-to-market for new discoveries and innovations in powder design, development, and quality control.

Phenom World has launched a new software – ParticleMetric, for the visualization and analysis of particles and powders.

The combination of ease of use and superb imaging quality of the Phenom desktop SEM with the imaging and particle analysis of ParticleMetric creates a powerful tool for inspecting a wide range of particle and powder samples. The Phenom desktop SEM with ParticleMetric software allows easy generation and analysis of SEM images. The integrated ParticleMetric software allows the user to gather morphology and particle size data for many submicron particle applications. The fully automated measurements of ParticleMetric allow a level of visual exploration beyond optical microscopy that can lead to new discoveries and innovations in powder design, development, and quality control.....

With the introduction of the ParticleMetric software, the visualization and analysis of particles are easier than ever before with the Phenom desktop SEM.

With the introduction of the next generation Phenom ProX desktop SEM Phenom-World confirms its position in the top of the high-end table top for SEM imaging and analysis.

With a magnification range up to 100,000x and resolution of 17nm the Phenom ProXdelivers more detailed information than ever before. Phenomenal imaging combined with outstanding technical performance. All-in-one system. The advanced Phenom ProX desktop SEM identifies different elements in a specimen by using the integrated Element Identification software with a specially designed EDS detector. With new techniques and software-developments, the magnification range has been extended from max. 45,000x to 100,000x magnification. Combined with a resolution of 17nm, the next generation Phenom ProX is a valuable instrument for a wide variety of applications...

With the introduction of the next generation Phenom ProX desktop SEM Phenom-World confirms its positions in the top of the high-end table top for SEM imaging and analysis.

With a magnification range up to 100,000x and resolution down to 17nm the Phenom ProX delivers more detailed information than ever before. All Phenom-World scanning electron microscopes are intuitive to use, compact, fast to create results and built to high quality standards. The most extended solution in the range is the next generation Phenom ProX. The advanced system identifies different elements in a specimen by using the integrated Element Identification software with a specially designed EDS detector. With new techniques and software-developments, the magnification range has been extended from max. 45,000x to 100,000x magnification. Combined with a resolution of 17nm, the next generation Phenom ProX is a valuable instrument for a wide variety of applications....

Phenom-World’s proX desktop SEM will deliver more detailed information in an even faster way. The leading supplier of desktop scanning electron microscopes extends its integrated Element Identification software package with a comprehensive Elemental Mapping and Line Scan option

All Phenom-World scanning electron microscopes are intuitive to use, compact, fast to create results and built to high quality standards. The most extended solution in the range is the Phenom proX. The advanced system identifies different elements in a specimen by using the integrated Element Identification software and specially designed EDS detector...

Forensic applications with Phenom

Every forensic laboratory contains a number of optical and digital microscopes. This is one of the primary requirements when setting up a forensic laboratory to perform routine imaging tasks. In general, these optical devices are robust and easy to operate. However the demand for magnifications beyond the optical range (>1000x) is increasing as the features of interest become smaller. Scanning Electron Microscopy (SEM) can go beyond the optical scale with very high magnifications and depth of focus....

Elemental Mapping is the first expansion of the Phenom proX EDS-technology. The new 2.0 Element Identification (EID) software and the introduction of Elemental Mapping create a state of the art combination of hardware integration and dedicated software

The Phenom proX is a fast and intuitive desktop electron microscope with fully integrated EDS elemental analysis. For pharmaceutical, chemical industries, failure analysis purposes and metallurgical applications as well as biological applications and forensics, the Phenom will give your whole team access to affordable and reliable imaging and material analysis

The importance of environmental quality demands that biologists both understand natural ecosystems and learn to be effective problem solvers

The new Phenom Programming Interface (PPI) is a must-have for any customer that wants to integrate their Phenom desktop SEM into a production process or for creating a customized solution...

Revealing the hidden treasures of all features on your sample is now possible with the Motorized Tilt & Rotation Sample Holder. Samples can have lines and holes, or have multi-layer structures. The new Motorized Tilt & Rotation Sample Holder allows analysis of the sample from all visible sides and enables a unique 3D image of your sample...

By using the customer's input and through continuous research, Phenom-World continuously strives to increase the value of the Phenom desktop SEM for its users. Phenom-World introduces regular improvements in both hardware and software to ensure that customers obtain the required information from the Phenom system in the most effective way. Phenom-World is focused on enabling you to keep up with continuously shrinking feature-sizes and increase your productivity, while bringing down the costs of analysis. The Phenom G2 pro is the most effective, versatile and fastest desktop SEM available...

Prolong the viewing time of vacuum-sensitive and vulnerable samples with the new Temperature Controlled Sample Holder and execute more analysis on your fiber materials with the improved Fibermetric application.