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publication date: Sep 4, 2014
author/source: Malvern Instruments Ltd

Dr Alan Rawle, Applications Manager for Malvern Instruments, will give a plenary lecture at Particulate Systems Analysis (PSA) 2014, organized by the Royal Society of Chemistry’s Particle Characterization Group.

alan rawleThe event takes place from 15-17 September 2014 at the Manchester Conference Centre, Manchester UK, and this year incorporates the UK Particle Technology Forum and Fine Bubble Symposium. The title of Dr Rawle’s lecture is ‘TLAs and the 4Qs in relation to elucidation of particle sizing issues’ where, of course, TLA stands for ‘Three-Letter Acronyms’.

“The prime objective is entertainment with an educational experience as a sideline,” said Alan Rawle. “I’ve used TLAs over the years as an aide memoire in particle size analysis. For instance, I’ll be introducing important particle size concepts, such as when one would want to use a particle counter - concentration, contamination, cleanliness, the 3Cs - as opposed to a particle size analyzer. Another example is nanotechnology particle properties, which can be thought through with the 4Ss - size, shape, surface, solubility.”

Dr Rawle is an expert in many areas of particle characterization and is the recent recipient of a Distinguished Service Award presented by the Chairman of the ASTM Committee E56 on Nanotechnology in recognition of his contribution to the Committee’s success and its development of a range of ASTM standards, as well as his continued mentoring and guidance of others.

In addition to Dr Rawle’s lecture, other members of the Malvern team will be making presentations as part of the conference sessions. On Monday 15 September Luke Green, Applications Specialist, will discuss ‘Morphological analysis of particle suspensions with automated imaging’ and on Wednesday 17 September Cathryn Langley, Application Development Scientist, will present ‘Particle Characterisation in Forensic Analysis’. On Tuesday 16 September ‘Developments in Characterisation of Suspensions by Nanoparticle Tracking Analysis  (NTA)’ will be the topic of a presentation given by Bob Carr, founder of NanoSight which is now part of Malvern Instruments.

Malvern’s technology is also represented in the Fine Bubble Symposium with a Malvern NanoSight NTA system presented on the FBIA (Fine Bubble Industries Association) booth.

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